Ellipsometric studies of (Cu6PS5I)1-x(Cu7PS6)x and (Cu6PS5Br)1-x(Cu7PS6)x mixed crystals

(Cu6PS5I)1–x(Cu7PS6)x and (Cu6PS5Br)1–x(Cu7PS6)x mixed crystals were grown using a direct crystallization technique from the melt. Refractive indices and extinction coefficients for mixed crystals were obtained from the spectral ellipsometry measurements. A nonlinear increase of the refractive indic...

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Autor principal:	I.P. Studenyak
Formato:	Artigo
Lenguaje:	Inglês
Publicado:	National Academy of Sciences of Ukraine. Institute of Semi conductor physics. 2019-09-01
Colección:	Semiconductor Physics, Quantum Electronics & Optoelectronics
Materias:	superionic conductors mixed crystals spectral ellipsometry refractive index extinction coefficient
Acceso en línea:	http://journal-spqeo.org.ua/n3_2019/P347-352abstr.html
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