Intelligent Fault Diagnosis Framework for Modular Multilevel Converters in HVDC Transmission

Open circuit failure mode in insulated-gate bipolar transistors (IGBT) is one of the most common faults in modular multilevel converters (MMCs). Several techniques for MMC fault diagnosis based on threshold parameters have been proposed, but very few studies have considered artificial intelligence (...

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主要な著者:	Hosameldin O. A. Ahmed, Yuexiao Yu, Qinghua Wang, Mohamed Darwish, Asoke K. Nandi
フォーマット:	Artigo
言語:	Inglês
出版事項:	MDPI AG 2022-01-01
シリーズ:	Sensors
主題:	MMC-HVDC fault detection fault classification principal component analysis (PCA) multiclass support vector machine (SVM) multinomial logistic regression (MLR)
オンライン･アクセス:	https://www.mdpi.com/1424-8220/22/1/362
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