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Intelligent Fault Diagnosis Framework for Modular Multilevel Converters in HVDC Transmission

Open circuit failure mode in insulated-gate bipolar transistors (IGBT) is one of the most common faults in modular multilevel converters (MMCs). Several techniques for MMC fault diagnosis based on threshold parameters have been proposed, but very few studies have considered artificial intelligence (...

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Hoofdauteurs: Hosameldin O. A. Ahmed, Yuexiao Yu, Qinghua Wang, Mohamed Darwish, Asoke K. Nandi
Formaat: Artigo
Taal:Inglês
Gepubliceerd in: MDPI AG 2022-01-01
Reeks:Sensors
Onderwerpen:
MMC-HVDC
fault detection
fault classification
principal component analysis (PCA)
multiclass support vector machine (SVM)
multinomial logistic regression (MLR)
Online toegang:https://www.mdpi.com/1424-8220/22/1/362
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