DC Performance Variations of SOI FinFETs with Different Silicide Thickness
DC performance and the variability of n-type silicon-on-insulator dopant-segregated FinFETs with different silicide thickness (Tsili) are analyzed. DC parameters including threshold voltage, low-field-mobility-related coefficient, and parasitic resistance are extracted from Y-function method for the...
Kaydedildi:
| Yazar: | |
|---|---|
| Materyal Türü: | Artigo |
| Dil: | Inglês |
| Baskı/Yayın Bilgisi: |
Wiley
2018-01-01
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| Seri Bilgileri: | Advances in Condensed Matter Physics |
| Online Erişim: | http://dx.doi.org/10.1155/2018/2426863 |
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