A Data-Driven Defect Diagnosis and Failure Analysis Method for Mass-Production SRAM Redundancy Optimization
As the area occupied by static random access memory (SRAM) continues to increase in advanced integrated circuits, SRAM yield has become a critical factor that directly constrains chip cost and manufacturing efficiency. Conventional SRAM redundancy configuration methods are largely based on ideal ran...
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| Principais autores: | , , , |
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| Format: | Artigo |
| Jezik: | Inglês |
| Izdano: |
MDPI AG
2026-05-01
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| Serija: | Applied Sciences |
| Teme: | |
| Online dostop: | https://www.mdpi.com/2076-3417/16/11/5381 |
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