Standard Sample Preparation for Serial Femtosecond Crystallography
The development of serial crystallography (SX), including serial synchrotron crystallography (SSX) at synchrotron sources and serial femtosecond crystallography (SFX) at X-ray free-electron lasers (XFELs), has facilitated the collection of high-resolution diffraction data from micron-sized crystals,...
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| Autors principals: | , , , |
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| Format: | Artigo |
| Idioma: | Inglês |
| Publicat: |
MDPI AG
2025-10-01
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| Col·lecció: | Biomolecules |
| Matèries: | |
| Accés en línia: | https://www.mdpi.com/2218-273X/15/11/1488 |
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