Microwave Absolute Distance Measurement Method with Ten-Micron-Level Accuracy and Meter-Level Range Based on Frequency Domain Interferometry

A microwave absolute distance measurement method with ten-micron-level accuracy and meter-level range based on frequency domain interferometry is proposed and experimentally demonstrated for the first time. Theoretical analysis indicates that an interference phenomenon occurs instantaneously in the...

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Hlavní autoři:	Longhuang Tang, Xing Jia, Heli Ma, Shenggang Liu, Yongchao Chen, Tianjiong Tao, Long Chen, Jian Wu, Chengjun Li, Xiang Wang, Jidong Weng
Médium:	Artigo
Jazyk:	Inglês
Vydáno:	MDPI AG 2023-09-01
Edice:	Sensors
Témata:	absolute distance broad-spectrum frequency domain interferometry microwave precise ranging
On-line přístup:	https://www.mdpi.com/1424-8220/23/18/7898
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