Microwave Absolute Distance Measurement Method with Ten-Micron-Level Accuracy and Meter-Level Range Based on Frequency Domain Interferometry

A microwave absolute distance measurement method with ten-micron-level accuracy and meter-level range based on frequency domain interferometry is proposed and experimentally demonstrated for the first time. Theoretical analysis indicates that an interference phenomenon occurs instantaneously in the...

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Λεπτομέρειες βιβλιογραφικής εγγραφής

Κύριοι συγγραφείς:	Longhuang Tang, Xing Jia, Heli Ma, Shenggang Liu, Yongchao Chen, Tianjiong Tao, Long Chen, Jian Wu, Chengjun Li, Xiang Wang, Jidong Weng
Μορφή:	Artigo
Γλώσσα:	Inglês
Έκδοση:	MDPI AG 2023-09-01
Σειρά:	Sensors
Θέματα:	absolute distance broad-spectrum frequency domain interferometry microwave precise ranging
Διαθέσιμο Online:	https://www.mdpi.com/1424-8220/23/18/7898
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