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Molecular Genetic Diversity and Line × Tester Analysis for Resistance to Late Wilt Disease and Grain Yield in Maize

Late wilt disease (LWD) caused by the fungus <i>Magnaporthiopsis maydis</i> poses a major threat to maize production. Developing high-yielding and resistant hybrids is vital to cope with this destructive disease. The present study aimed at assessing general (GCA) and specific (SCA) combining abiliti...

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Autores principales: Mohamed M. Kamara, Nasr A. Ghazy, Elsayed Mansour, Mohsen M. Elsharkawy, Ahmed M. S. Kheir, Khaled M. Ibrahim
Formato: Artigo
Lenguaje:Inglês
Publicado: MDPI AG 2021-05-01
Colección:Agronomy
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Acceso en línea:https://www.mdpi.com/2073-4395/11/5/898
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