Molecular Genetic Diversity and Line × Tester Analysis for Resistance to Late Wilt Disease and Grain Yield in Maize
Late wilt disease (LWD) caused by the fungus <i>Magnaporthiopsis maydis</i> poses a major threat to maize production. Developing high-yielding and resistant hybrids is vital to cope with this destructive disease. The present study aimed at assessing general (GCA) and specific (SCA) combining abiliti...
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| Principais autores: | , , , , , |
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| Formato: | Artigo |
| Idioma: | Inglês |
| Publicado em: |
MDPI AG
2021-05-01
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| coleção: | Agronomy |
| Assuntos: | |
| Acesso em linha: | https://www.mdpi.com/2073-4395/11/5/898 |
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