New Figure-of-Merit Combining Semiconductor and Multi-Level Converter Properties
Figures-of-Merit (FOMs) are widely-used to compare power semiconductor materials and devices and to motivate research and development of new technology nodes. These material- and device-specific FOMs, however, fail to directly translate into quantifiable performance in a specific power electronics a...
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| Автори: | , , , |
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| Формат: | Artigo |
| Мова: | Inglês |
| Опубліковано: |
IEEE
2020-01-01
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| Серія: | IEEE Open Journal of Power Electronics |
| Предмети: | |
| Онлайн доступ: | https://ieeexplore.ieee.org/document/9172101/ |
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