New Figure-of-Merit Combining Semiconductor and Multi-Level Converter Properties
Figures-of-Merit (FOMs) are widely-used to compare power semiconductor materials and devices and to motivate research and development of new technology nodes. These material- and device-specific FOMs, however, fail to directly translate into quantifiable performance in a specific power electronics a...
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| Auteurs principaux: | , , , |
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| Format: | Artigo |
| Langue: | Inglês |
| Publié: |
IEEE
2020-01-01
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| Collection: | IEEE Open Journal of Power Electronics |
| Sujets: | |
| Accès en ligne: | https://ieeexplore.ieee.org/document/9172101/ |
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