Reliability analysis of a CNT-TF-FinFET for hostile temperature
In the concerned research work, an extensive study has been carried out for a newly developed carbon nanotube truncated fin (CNT-TF) FinFET from an analog as well as a linearity point of view. All the simulated work has been gleaned for n-type FET on Silvaco software for TCAD. Firstly, CNT-TF-FinFET...
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| Autori principali: | , , |
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| Natura: | Artigo |
| Lingua: | Inglês |
| Pubblicazione: |
Elsevier
2023-12-01
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| Serie: | e-Prime: Advances in Electrical Engineering, Electronics and Energy |
| Soggetti: | |
| Accesso online: | http://www.sciencedirect.com/science/article/pii/S2772671123002693 |
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