Conducted Common-Mode Electromagnetic Interference Analysis of Gate Drivers for High-Voltage SiC Devices
Power conversion equipment based on high-voltage SiC devices offers significant advantages in efficiency and power density. However, during high-voltage, high-power switching operations, severe electromagnetic interference (EMI) can easily occur. It could cause the false triggering of devices and re...
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| Egile Nagusiak: | , , , , |
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| Formatua: | Artigo |
| Hizkuntza: | Inglês |
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MDPI AG
2025-11-01
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| Saila: | Energies |
| Gaiak: | |
| Sarrera elektronikoa: | https://www.mdpi.com/1996-1073/18/23/6083 |
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