A Survey of GaN HEMT Technologies for Millimeter-Wave Low Noise Applications

This article presents a set of measured benchmarks for the noise and gain performance of six different millimeter-wave (mm-wave) gallium nitride (GaN) high electron mobility transistor (HEMT) technologies fabricated at four different foundries in the United States. Measurements of the GaN transistor...

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主要な著者:	Nicholas C. Miller, Andrea Arias-Purdue, Erdem Arkun, David Brown, James F. Buckwalter, Robert L. Coffie, Andrea Corrion, Daniel J. Denninghoff, Michael Elliott, Dave Fanning, Ryan Gilbert, Daniel S. Green, Florian Herrault, Ben Heying, Casey M. King, Eythan Lam, Jeong-Sun Moon, Petra V. Rowell, Georges Siddiqi, Ioulia Smorchkova, Joe Tai, Jansen Uyeda, Mike Wojtowicz
フォーマット:	Artigo
言語:	Inglês
出版事項:	IEEE 2023-01-01
シリーズ:	IEEE Journal of Microwaves
主題:	Gallium nitride (GaN) high electron mobility transistor (HEMT) noise parameters low noise amplifier
オンライン･アクセス:	https://ieeexplore.ieee.org/document/10260709/
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