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Analysis of Distortion Based on 2D MEMS Micromirror Scanning Projection System

To analyze the distortion problem of two-dimensional micro-electromechanical system (MEMS) micromirror in-plane scanning, this paper makes a full theoretical analysis of the distortion causes from many aspects. Firstly, the mathematical relations among the deflection angle, laser incidence angle, an...

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Bibliografski detalji
Glavni autori: Xichen Wang, Yingke Xie, Hengheng Liang, Nianbing Zhong
Format: Artigo
Jezik:Inglês
Izdano: MDPI AG 2021-07-01
Serija:Micromachines
Teme:
Online pristup:https://www.mdpi.com/2072-666X/12/7/818
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