Analysis of Distortion Based on 2D MEMS Micromirror Scanning Projection System
To analyze the distortion problem of two-dimensional micro-electromechanical system (MEMS) micromirror in-plane scanning, this paper makes a full theoretical analysis of the distortion causes from many aspects. Firstly, the mathematical relations among the deflection angle, laser incidence angle, an...
में बचाया:
| मुख्य लेखकों: | , , , |
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| स्वरूप: | Artigo |
| भाषा: | Inglês |
| प्रकाशित: |
MDPI AG
2021-07-01
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| श्रृंखला: | Micromachines |
| विषय: | |
| ऑनलाइन पहुंच: | https://www.mdpi.com/2072-666X/12/7/818 |
| टैग: |
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