Crystal Growth and Characterization of ZrSiS-Type Topological Dirac Semimetals

WHM materials (W = Zr/Hf, H = Si/Ge/Sn, M = S/Se/Te) represent a large family of topological semimetals, which have attracted intensive interest since they are considered to be good candidates for studying various topological states. Here, we report the crystal growth, characterization, and electron...

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Bibliografski detalji

Glavni autori:	Ying Yang, Peng Zhu, Liu Yang, Jinjin Liu, Yongkai Li, Zhiwei Wang
Format:	Artigo
Jezik:	Inglês
Izdano:	MDPI AG 2022-05-01
Serija:	Crystals
Teme:	Dirac semimetal crystal growth electronic properties X-ray diffraction
Online pristup:	https://www.mdpi.com/2073-4352/12/5/728
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