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Crystal Growth and Characterization of ZrSiS-Type Topological Dirac Semimetals

WHM materials (W = Zr/Hf, H = Si/Ge/Sn, M = S/Se/Te) represent a large family of topological semimetals, which have attracted intensive interest since they are considered to be good candidates for studying various topological states. Here, we report the crystal growth, characterization, and electron...

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Autors principals: Ying Yang, Peng Zhu, Liu Yang, Jinjin Liu, Yongkai Li, Zhiwei Wang
Format: Artigo
Idioma:Inglês
Publicat: MDPI AG 2022-05-01
Col·lecció:Crystals
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Accés en línia:https://www.mdpi.com/2073-4352/12/5/728
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