Thermal Diffusivity Imaging of CFRP: Spatial Correlation Between Lock-In Thermography-Based Measurement and Synchrotron X-Ray CT Simulation on Identical Region
With the increasing adoption of wide-bandgap semiconductors such as SiC and GaN in high-power electronics, the thermal management of semiconductor devices has become critical [...]
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| Principais autores: | , , |
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| Formato: | Artigo |
| Idioma: | Inglês |
| Publicado em: |
MDPI AG
2025-09-01
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| coleção: | Proceedings |
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| Acesso em linha: | https://www.mdpi.com/2504-3900/129/1/57 |
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