Thermal Diffusivity Imaging of CFRP: Spatial Correlation Between Lock-In Thermography-Based Measurement and Synchrotron X-Ray CT Simulation on Identical Region
With the increasing adoption of wide-bandgap semiconductors such as SiC and GaN in high-power electronics, the thermal management of semiconductor devices has become critical [...]
-д хадгалсан:
| Үндсэн зохиолчид: | , , |
|---|---|
| Формат: | Artigo |
| Хэл сонгох: | Inglês |
| Хэвлэсэн: |
MDPI AG
2025-09-01
|
| Цуврал: | Proceedings |
| Нөхцлүүд: | |
| Онлайн хандалт: | https://www.mdpi.com/2504-3900/129/1/57 |
| Шошгууд: |
Шошго байхгүй, Энэхүү баримтыг шошголох эхний хүн болох!
|