Lateral Force Calibration Method Used for Calibration of Atomic Force Microscope
Modern heterogeneous micro- and nanostructures usually integrate modules fabricated using various materials and technologies. Moreover, it has to be emphasized that the macro and micro nanoscale material parameters are not the same. For this reason it has become crucial to identify the nanomechanic...
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| Principais autores: | , |
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| Format: | Artigo |
| Jezik: | Inglês |
| Izdano: |
National Institute of Telecommunications
2023-06-01
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| Serija: | Journal of Telecommunications and Information Technology |
| Teme: | |
| Online dostop: | https://jtit.pl/jtit/article/view/985 |
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