A Scalable Formal Framework for the Verification and Vulnerability Analysis of Redundancy-Based Error-Resilient Null Convention Logic Asynchronous Circuits
The increasing demand for high-speed, energy-efficient, and miniaturized electronics has led to significant challenges and compromises in the domain of conventional clock-based digital designs, most notably reduced circuit reliability, particularly in mission-critical hardware. At scaled technology...
-д хадгалсан:
| Үндсэн зохиолчид: | , , , |
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| Формат: | Artigo |
| Хэл сонгох: | Inglês |
| Хэвлэсэн: |
MDPI AG
2024-01-01
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| Цуврал: | Journal of Low Power Electronics and Applications |
| Нөхцлүүд: | |
| Онлайн хандалт: | https://www.mdpi.com/2079-9268/14/1/5 |
| Шошгууд: |
Шошго байхгүй, Энэхүү баримтыг шошголох эхний хүн болох!
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