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A Scalable Formal Framework for the Verification and Vulnerability Analysis of Redundancy-Based Error-Resilient Null Convention Logic Asynchronous Circuits

The increasing demand for high-speed, energy-efficient, and miniaturized electronics has led to significant challenges and compromises in the domain of conventional clock-based digital designs, most notably reduced circuit reliability, particularly in mission-critical hardware. At scaled technology...

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-д хадгалсан:
Номзүйн дэлгэрэнгүй
Үндсэн зохиолчид: Dipayan Mazumder, Mithun Datta, Alexander C. Bodoh, Ashiq A. Sakib
Формат: Artigo
Хэл сонгох:Inglês
Хэвлэсэн: MDPI AG 2024-01-01
Цуврал:Journal of Low Power Electronics and Applications
Нөхцлүүд:
Онлайн хандалт:https://www.mdpi.com/2079-9268/14/1/5
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