Probing millicharged particles at an electron beam dump with ultralow-threshold sensors
Abstract We propose to search for millicharged particles produced in high-intensity electron beam dumps using small ultralow-threshold sensors. As a concrete example, we consider a Skipper-CCD placed behind the beam dump in Hall A at Jefferson Lab. We compute the millicharged particle flux, includin...
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| Główni autorzy: | , , , , , |
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| Format: | Artigo |
| Język: | Inglês |
| Wydane: |
SpringerOpen
2025-04-01
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| Seria: | Journal of High Energy Physics |
| Hasła przedmiotowe: | |
| Dostęp online: | https://doi.org/10.1007/JHEP04(2025)057 |
| Etykiety: |
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