Probing millicharged particles at an electron beam dump with ultralow-threshold sensors
Abstract We propose to search for millicharged particles produced in high-intensity electron beam dumps using small ultralow-threshold sensors. As a concrete example, we consider a Skipper-CCD placed behind the beam dump in Hall A at Jefferson Lab. We compute the millicharged particle flux, includin...
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| Автори: | , , , , , |
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| Формат: | Artigo |
| Мова: | Inglês |
| Опубліковано: |
SpringerOpen
2025-04-01
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| Серія: | Journal of High Energy Physics |
| Предмети: | |
| Онлайн доступ: | https://doi.org/10.1007/JHEP04(2025)057 |
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