Axial Resolution Enhancement of Optical Sectioning Structured Illumination Microscopy Based on Three-Beam Interference

As a branch of 3D microscopy, optical sectioning structured illumination microscopy (OS-SIM) has the advantages of fast imaging speed, weak photobleaching and phototoxicity, and flexible and compatible configuration. Although the method of using the one-dimensional periodic fringe pattern projected...

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Hlavní autoři:	Chao Xiao, Xing Li, Jia Qian, Wang Ma, Junwei Min, Peng Gao, Dan Dan, Baoli Yao
Médium:	Artigo
Jazyk:	Inglês
Vydáno:	MDPI AG 2023-06-01
Edice:	Photonics
Témata:	structured illumination microscopy optical sectioning three-beam interference axial resolution 3D microscopy
On-line přístup:	https://www.mdpi.com/2304-6732/10/6/682
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