Axial Resolution Enhancement of Optical Sectioning Structured Illumination Microscopy Based on Three-Beam Interference

As a branch of 3D microscopy, optical sectioning structured illumination microscopy (OS-SIM) has the advantages of fast imaging speed, weak photobleaching and phototoxicity, and flexible and compatible configuration. Although the method of using the one-dimensional periodic fringe pattern projected...

Ausführliche Beschreibung

Bibliografische Detailangaben

Hauptverfasser:	Chao Xiao, Xing Li, Jia Qian, Wang Ma, Junwei Min, Peng Gao, Dan Dan, Baoli Yao
Format:	Artigo
Sprache:	Inglês
Veröffentlicht:	MDPI AG 2023-06-01
Schriftenreihe:	Photonics
Schlagworte:	structured illumination microscopy optical sectioning three-beam interference axial resolution 3D microscopy
Online-Zugang:	https://www.mdpi.com/2304-6732/10/6/682
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