Ion Migration and Space‐Charge Zones in Metal Halide Perovskites Through Short‐Circuit Transient Current and Numerical Simulations

Abstract The inherent ion migration in metal halide perovskite materials is known to induce deleterious and highly unstable dark currents in X‐ and γ‐ray detectors based on those compounds upon bias application. Dark current slow drift with time is identified as one of the major drawbacks for these...

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Autors principals:	Agustin O. Alvarez, Marisé García‐Batlle, Ferdinand Lédée, Eric Gros‐Daillon, Javier Mayén Guillén, Jean‐Marie Verilhac, Thibault Lemercier, Julien Zaccaro, Lluis F. Marsal, Osbel Almora, Germà Garcia‐Belmonte
Format:	Artigo
Idioma:	Inglês
Publicat:	Wiley-VCH 2024-11-01
Col·lecció:	Advanced Electronic Materials
Matèries:	charge carrier mobility drift‐diffusion simulations ionic conductivity metal halide perovskites x‐ray detectors
Accés en línia:	https://doi.org/10.1002/aelm.202400241
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