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Performance study of non-recess structure for β-Ga2O3 MOSFETs applications

In this work, high-quality β-Ga2O3 epitaxial layers were grown on c-plane sapphire substrates via metalorganic chemical vapor deposition. The device structure sequentially comprised a heavily doped Ga2O3 layer (10 nm), a lightly doped Ga2O3 layer (10 nm), an (Al0.21Ga0.79)2O3 layer (10 nm), and an u...

Whakaahuatanga katoa

I tiakina i:
Ngā taipitopito rārangi puna kōrero
Ngā kaituhi matua: Chun-Chia Chang, Sheng-Ti Chung, Siddharth Rana, Kenneth Järrendahl, Ching-Lien Hsiao, Ray-Hua Horng
Hōputu: Artigo
Reo:Inglês
I whakaputaina: Elsevier 2026-03-01
Rangatū:Results in Engineering
Ngā marau:
Urunga tuihono:http://www.sciencedirect.com/science/article/pii/S2590123025048005
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