QTL mapping for leaf rust resistance in bread wheat using PBW343/W8627 RIL population

IntroductionLeaf rust, caused by Puccinia triticina, inflicts 10-50% yield losses in bread wheat, with newly emerging virulent pathotypes overcoming major Lr genes and rendering the cultivars susceptible. The identification of genetic loci conferring resistance to wheat leaf rust, coupled with the d...

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Principais autores:	K. S. Vindhya, Renu Sharma, Satish Kumar, Pramod Prasad, Prem Lal Kashyap, Rajender Singh, M. Sivasamy, Sripada M. Udupa, Indu Sharma, Ratan Tiwari, Pradeep Sharma
格式:	Artigo
語言:	Inglês
出版:	Frontiers Media S.A. 2026-07-01
叢編:	Frontiers in Plant Science
主題:	all stage resistance (ASR) bread wheat DArT leaf rust QTLs
在線閱讀:	https://www.frontiersin.org/articles/10.3389/fpls.2026.1851529/full
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