QTL mapping for leaf rust resistance in bread wheat using PBW343/W8627 RIL population
IntroductionLeaf rust, caused by Puccinia triticina, inflicts 10-50% yield losses in bread wheat, with newly emerging virulent pathotypes overcoming major Lr genes and rendering the cultivars susceptible. The identification of genetic loci conferring resistance to wheat leaf rust, coupled with the d...
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| Автори: | , , , , , , , , , , |
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| Формат: | Artigo |
| Мова: | Inglês |
| Опубліковано: |
Frontiers Media S.A.
2026-07-01
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| Серія: | Frontiers in Plant Science |
| Предмети: | |
| Онлайн доступ: | https://www.frontiersin.org/articles/10.3389/fpls.2026.1851529/full |
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