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A study on the epitaxial Bi2Se3 thin film grown by vapor phase epitaxy

We report the growth of high quality Bi2Se3 thin films on Al2O3 substrates by using chemical vapor deposition. From the atomic force microscope, x-ray diffraction and transmission electron microscope measurements we found that the films are of good crystalline quality, have two distinct domains and...

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Autors principals: Yen-Cheng Lin, Yu-Sung Chen, Chao-Chun Lee, Jen-Kai Wu, Hsin-Yen Lee, Chi-Te Liang, Yuan Huei Chang
Format: Artigo
Idioma:Inglês
Publicat: AIP Publishing LLC 2016-06-01
Col·lecció:AIP Advances
Accés en línia:http://dx.doi.org/10.1063/1.4954735
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