Wheat leaf localization and segmentation for yellow rust disease detection in complex natural backgrounds
Wheat yellow rust disease poses a significant threat to global wheat yield and grain quality. Early detection of this disease will help to minimize the loss caused by its effects. Existing models work well on images taken in a controlled environment, whereas a uniform background is placed behind the...
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| Hlavní autoři: | , , , , |
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| Médium: | Artigo |
| Jazyk: | Inglês |
| Vydáno: |
Elsevier
2024-11-01
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| Edice: | Alexandria Engineering Journal |
| Témata: | |
| On-line přístup: | http://www.sciencedirect.com/science/article/pii/S1110016824010329 |
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