Active Radiation-Hardening Strategy in Bulk FinFETs
In this article, we present a new method to mitigate the effect of the charge collected by trigate FinFET devices after an ionizing particle impact. The method is based on the creation of an internal structure that generates an electrical field that drives the charge generated by the ion track out o...
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| Hauptverfasser: | , , , |
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| Format: | Artigo |
| Sprache: | Inglês |
| Veröffentlicht: |
IEEE
2020-01-01
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| Schriftenreihe: | IEEE Access |
| Schlagworte: | |
| Online-Zugang: | https://ieeexplore.ieee.org/document/9249242/ |
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