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Study on the efficiency droop in high-quality GaN material under high photoexcitation intensity

III–V nitride semiconductors, represented by GaN, have attracted significant research attention. Driven by the growing interest in smart micro-displays, there is a strong desire to achieve enhanced light output from even smaller light-emitting diode (LED) chips. However, the most perplexing phenomen...

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Bibliografiske detaljer
Principais autores: Peng Chen, Zili Xie, Xiangqian Xiu, Dunjun Chen, Bin Liu, Hong Zhao, Yi Shi, Rong Zhang, Youdou Zheng
Format: Artigo
Sprog:Inglês
Udgivet: AIP Publishing LLC 2025-08-01
Serier:AIP Advances
Online adgang:http://dx.doi.org/10.1063/5.0261594
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