Defect Complexes in CrSBr Revealed Through Electron Microscopy and Deep Learning
Atomic defects underpin the properties of van der Waals materials, and their understanding is essential for advancing quantum and energy technologies. Scanning transmission electron microscopy is a powerful tool for defect identification in atomically thin materials, and extending it to multilayer a...
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| Glavni autori: | , , , , , , , , , , , |
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| Format: | Artigo |
| Jezik: | Inglês |
| Izdano: |
American Physical Society
2025-06-01
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| Serija: | Physical Review X |
| Online pristup: | http://doi.org/10.1103/PhysRevX.15.021080 |
| Oznake: |
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