Transcriptional coupling (Mfd) and DNA damage scanning (DisA) coordinate excision repair events for efficient Bacillus subtilis spore outgrowth

Abstract The absence of base excision repair (BER) proteins involved in processing ROS‐promoted genetic insults activates a DNA damage scanning (DisA)‐dependent checkpoint event in outgrowing Bacillus subtilis spores. Here, we report that genetic disabling of transcription‐coupled repair (TCR) or nu...

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主要な著者:	Luz I. Valenzuela‐García, Víctor M. Ayala‐García, Ana G. Regalado‐García, Peter Setlow, Mario Pedraza‐Reyes
フォーマット:	Artigo
言語:	Inglês
出版事項:	Wiley 2018-10-01
シリーズ:	MicrobiologyOpen
主題:	Bacillus subtilis DisA germination/outgrowth NER TCR
オンライン･アクセス:	https://doi.org/10.1002/mbo3.593
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