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Electronic structure calculations on gallium-vacancy defects in Si1-xGex

Abstract Silicon germanium (Si1 − xGex) has emerged as a mainstream nanoelectronic material and as such its defect processes and energetics are technologically important. In semiconductor alloys the interaction of intrinsic point defects such as vacancies with dopant atoms are critical for the physi...

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Bibliografiset tiedot
Päätekijät: Stavros-Richard G. Christopoulos, Emmanuel Igumbor, Edwin Mapasha, Alexander Chroneos
Aineistotyyppi: Artigo
Kieli:Inglês
Julkaistu: Nature Portfolio 2025-11-01
Sarja:Scientific Reports
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Linkit:https://doi.org/10.1038/s41598-025-25115-z
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