A Soft Error Self-Resilience Radiation-Hardened 14T SRAM for Aerospace Applications
Various charged particles in space threaten memory circuit integrity and dependability, including photons, alpha particles, and high-energy ions outside the Low Earth Orbit region. These particles particularly affect conventional 6T SRAM by disrupting stored bits, leading researchers to explore radi...
Kaydedildi:
| Asıl Yazarlar: | , , , , , , , |
|---|---|
| Materyal Türü: | Artigo |
| Dil: | Inglês |
| Baskı/Yayın Bilgisi: |
IEEE
2025-01-01
|
| Seri Bilgileri: | IEEE Access |
| Konular: | |
| Online Erişim: | https://ieeexplore.ieee.org/document/11122867/ |
| Etiketler: |
Etiket eklenmemiş, İlk siz ekleyin!
|