Industrial Image Anomaly Detection via Self-Supervised Learning with Feature Enhancement Assistance
Industrial anomaly detection is constrained by the scarcity of anomaly samples, limiting the applicability of supervised learning methods. Many studies have focused on anomaly detection by generating anomaly images and adopting self-supervised learning approaches. Leveraging pre-trained networks on...
Guardado en:
| Autores principales: | , |
|---|---|
| Formato: | Artigo |
| Lenguaje: | Inglês |
| Publicado: |
MDPI AG
2024-08-01
|
| Colección: | Applied Sciences |
| Materias: | |
| Acceso en línea: | https://www.mdpi.com/2076-3417/14/16/7301 |
| Etiquetas: |
Sin Etiquetas, Sea el primero en etiquetar este registro!
|