Molecular surface coverage standards by reference-free GIXRF supporting SERS and SEIRA substrate benchmarking

Non-destructive reference-free grazing incidence X-ray fluorescence (RF-GIXRF) is proposed as a highly effective analytical technique for extracting molecular arrangement density in self-assembled monolayers. The establishment of surface density standards through RF-GIXRF impacts various application...

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Autors principals:	Cara Eleonora, Hönicke Philipp, Kayser Yves, Beckhoff Burkhard, Giovannozzi Andrea M., Klapetek Petr, Zoccante Alberto, Cossi Maurizio, Tay Li-Lin, Boarino Luca, Ferrarese Lupi Federico
Format:	Artigo
Idioma:	Inglês
Publicat:	Wiley 2024-08-01
Col·lecció:	Nanophotonics
Matèries:	self-assembled monolayer grazing-incidence x-ray fluorescence sers seira molecular surface density surface coverage standards
Accés en línia:	https://doi.org/10.1515/nanoph-2024-0222
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