Molecular surface coverage standards by reference-free GIXRF supporting SERS and SEIRA substrate benchmarking
Non-destructive reference-free grazing incidence X-ray fluorescence (RF-GIXRF) is proposed as a highly effective analytical technique for extracting molecular arrangement density in self-assembled monolayers. The establishment of surface density standards through RF-GIXRF impacts various application...
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| Principais autores: | , , , , , , , , , , |
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| Format: | Artigo |
| Sprog: | Inglês |
| Udgivet: |
Wiley
2024-08-01
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| Serier: | Nanophotonics |
| Fag: | |
| Online adgang: | https://doi.org/10.1515/nanoph-2024-0222 |
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