Mapping of Nanomechanical Properties of Enamel Surfaces Due to Orthodontic Treatment by AFM Method

Background: Atomic force microscopy imaging was used to study the structural topography of enamel crystals in healthy and affected enamel. The correlation of topographic images with nanomechanical properties allows for the assessment of morphology and properties at the micro- and nano-meter level in...

詳細記述

書誌詳細

主要な著者:	Monika Machoy, Sławomir Wilczyński, Liliana Szyszka-Sommerfeld, Krzysztof Woźniak, Anna Deda, Sławomir Kulesza
フォーマット:	Artigo
言語:	Inglês
出版事項:	MDPI AG 2021-04-01
シリーズ:	Applied Sciences
主題:	orthodontics enamel AFM atomic force microscopy nanomechanical properties enamel roughness
オンライン･アクセス:	https://www.mdpi.com/2076-3417/11/9/3918
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