Propiedades Ópticas de Películas Delgadas de a-Si:H Producidas por Evaporacion
The Reflectance and Transmitance measurements of a-Si:H thin films prepared by quick evaporation under various substrate temperature Ts and hydrogen partial pressure Ph, have been carried out. Shift absorption edge with Ts and Ph has been studied and related to the hydrogen content and the depositio...
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| Hauptverfasser: | , , |
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| Format: | Artigo |
| Sprache: | Inglês |
| Veröffentlicht: |
Universidad Nacional de Colombia
1991-07-01
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| Schriftenreihe: | Momento |
| Schlagworte: | |
| Online-Zugang: | https://revistas.unal.edu.co/index.php/momento/article/view/35196 |
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