Scanning cathodoluminescence microscopy: applications in semiconductor and metallic nanostructures

Cathodoluminescence (CL) as a radiative light produced by an electron beam exciting a luminescent material, has been widely used in imaging and spectroscopic detection of semiconductor, mineral and biological samples with an ultrahigh spatial resolution. Conventional CL spectroscopy shows an excelle...

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Hlavní autoři:	Liu Zhixin, Jiang Meiling, Hu Yanglin, Lin Feng, Shen Bo, Zhu Xing, Fang Zheyu
Médium:	Artigo
Jazyk:	Inglês
Vydáno:	Editorial Office of Opto-Electronic Journals Group, Institute of Optics and Electronics, CAS, China 2018-02-01
Edice:	Opto-Electronic Advances
Témata:	cathodoluminescence microscopy semiconductor metallic nanostructures surface plasmons
On-line přístup:	http://www.oejournal.org/article/doi/10.29026/oea.2018.180007
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