Scanning cathodoluminescence microscopy: applications in semiconductor and metallic nanostructures
Cathodoluminescence (CL) as a radiative light produced by an electron beam exciting a luminescent material, has been widely used in imaging and spectroscopic detection of semiconductor, mineral and biological samples with an ultrahigh spatial resolution. Conventional CL spectroscopy shows an excelle...
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| Autors principals: | , , , , , , |
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| Format: | Artigo |
| Idioma: | Inglês |
| Publicat: |
Editorial Office of Opto-Electronic Journals Group, Institute of Optics and Electronics, CAS, China
2018-02-01
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| Col·lecció: | Opto-Electronic Advances |
| Matèries: | |
| Accés en línia: | http://www.oejournal.org/article/doi/10.29026/oea.2018.180007 |
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