Simultaneous multi-dimensional spatial frequency modulation imaging
One of the primary challenges in advanced manufacturing (AM) is the lack of efficient optical metrics for ensuring quality control over the manufacturing process. Many current imaging techniques have excessive data requirements and require computationally intensive post-processing to effectively cha...
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| Autori principali: | , , , , , |
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| Natura: | Artigo |
| Lingua: | Inglês |
| Pubblicazione: |
Taylor & Francis Group
2020-01-01
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| Serie: | International Journal of Optomechatronics |
| Soggetti: | |
| Accesso online: | http://dx.doi.org/10.1080/15599612.2019.1694610 |
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