Simultaneous multi-dimensional spatial frequency modulation imaging
One of the primary challenges in advanced manufacturing (AM) is the lack of efficient optical metrics for ensuring quality control over the manufacturing process. Many current imaging techniques have excessive data requirements and require computationally intensive post-processing to effectively cha...
Kaydedildi:
| Asıl Yazarlar: | , , , , , |
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| Materyal Türü: | Artigo |
| Dil: | Inglês |
| Baskı/Yayın Bilgisi: |
Taylor & Francis Group
2020-01-01
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| Seri Bilgileri: | International Journal of Optomechatronics |
| Konular: | |
| Online Erişim: | http://dx.doi.org/10.1080/15599612.2019.1694610 |
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