Integrated diagnosis optimization design of the electronic equipment based on spatial mapping
The complexity of test and fault information within electronic devices makes their integrated diagnosis a challenging problem when designing equipment reliability. Current integrated diagnosis is analyzed for test optimization and test resource optimization. However, this neglects the connection bet...
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| Principais autores: | , |
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| Formato: | Artigo |
| Idioma: | Inglês |
| Publicado em: |
SAGE Publishing
2024-10-01
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| Colecção: | Science Progress |
| Acesso em linha: | https://doi.org/10.1177/00368504241285770 |
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