Sb-Doped Substrates for Low-Noise Silicon Photomultipliers
Suppressing dark noise in silicon photomultipliers (SiPMs) remains highly challenging because Geiger-mode operation inherently leads to high dark count rates (DCR). Although epitaxial silicon layers grown on heavily doped substrates are widely employed, high-temperature epitaxial processing often in...
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| Hoofdauteurs: | , , , , , , , |
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| Formaat: | Artigo |
| Taal: | Inglês |
| Gepubliceerd in: |
IEEE
2026-01-01
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| Reeks: | IEEE Journal of the Electron Devices Society |
| Onderwerpen: | |
| Online toegang: | https://ieeexplore.ieee.org/document/11371612/ |
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